Principles and methods used in spectrometers for reference measurements of particles with dimension from one nanometer up to several microns

L. Bustin, T. Tritsher, J. Farnsworth, S. Elzey, H.-G. Horn, B. Osmondson, R. Caldow and O.F. Bischof Al’manac of Modern Metrology № 2 (14) 2018, pages 176–181 It is possible to get precision particles size distribution and fulfill instruments calibration in range from 1,1 nm to several micrometers by SMPS™ TSI spectrometers and aerosol generators. Key … Continue reading Principles and methods used in spectrometers for reference measurements of particles with dimension from one nanometer up to several microns